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Instrumentation and Measurement Techniques-A Measurement Process to Characterize Natural and Engineered Low-Loss Uniaxial Dielectric Materials at Microwave Frequencies
Other Scholarly Work
Overview
Additional Document Info
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Overview
cited authors
Mumcu, G; Sertel, K; Volakis, JL
authors
Volakis, John
publication date
January 1, 2008
Additional Document Info
start page
217
end page
223
volume
56