Analysis of the wavelength-to-depth encoded interference microscopy for three-dimensional imaging Article

Li, GQ, Fainman, Y. (2002). Analysis of the wavelength-to-depth encoded interference microscopy for three-dimensional imaging . OPTICAL ENGINEERING, 41(6), 1281-1288. 10.1117/1.1474439

cited authors

  • Li, GQ; Fainman, Y

authors

publication date

  • June 1, 2002

published in

keywords

  • Fourier optics
  • Optics
  • Physical Sciences
  • ROUGH SURFACES
  • Science & Technology
  • coherence
  • interference microscopy
  • three-dimensional imaging

Digital Object Identifier (DOI)

publisher

  • SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

start page

  • 1281

end page

  • 1288

volume

  • 41

issue

  • 6