Optical 2-D Fourier Transform Spectroscopy of Excitons in Semiconductor Nanostructures Article

Cundiff, Steven T, Bristow, Alan D, Siemens, Mark et al. (2012). Optical 2-D Fourier Transform Spectroscopy of Excitons in Semiconductor Nanostructures . IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 18(1), 318-328. 10.1109/JSTQE.2011.2123876

cited authors

  • Cundiff, Steven T; Bristow, Alan D; Siemens, Mark; Li, Hebin; Moody, Galan; Karaiskaj, Denis; Dai, Xingcan; Zhang, Tianhao

sustainable development goals

authors

publication date

  • January 1, 2012

webpage

published in

keywords

  • 4-WAVE-MIXING LINE-SHAPES
  • BIEXCITONS
  • EXCITATION
  • Engineering
  • Engineering, Electrical & Electronic
  • Optics
  • PHASE
  • Physical Sciences
  • Physics
  • Physics, Applied
  • QUANTUM BEATS
  • Quantum Science & Technology
  • RELAXATION
  • SPECTRAL INTERFEROMETRY
  • STATE
  • Science & Technology
  • Semiconductor nanostructures
  • Technology
  • spectroscopy
  • ultrafast optics

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 318

end page

  • 328

volume

  • 18

issue

  • 1