Structural characterization of chemically deposited PbS thin films Article

Fernandez-Lima, FA, Gonzalez-Alfaro, Y, Larramendi, EM et al. (2007). Structural characterization of chemically deposited PbS thin films . Materials Science & Engineering B: Solid-State Materials for Advanced Technology, 136(2-3), 187-192. 10.1016/j.mseb.2006.09.029

International Collaboration

cited authors

  • Fernandez-Lima, FA; Gonzalez-Alfaro, Y; Larramendi, EM; Fonseca Filho, HD; Maia da Costa, MEH; Freire, FL; Prioli, R; de Avillez, RR; da Silveira, EF; Calzadilla, O; de Melo, O; Pedrero, E; Hernandez, E

authors

publication date

  • January 25, 2007

published in

keywords

  • GROWTH
  • MICROSCOPY
  • MOLECULES
  • MONOLAYERS
  • Materials Science
  • Materials Science, Multidisciplinary
  • NANOCLUSTERS
  • NANORODS
  • PHOTOSENSITIVITY
  • Physical Sciences
  • Physics
  • Physics, Condensed Matter
  • ROOM-TEMPERATURE
  • SURFACE
  • Science & Technology
  • TEMPLATES
  • Technology
  • diffraction
  • ion beam
  • semiconductors
  • sulfides
  • surface morphology
  • thin films

Digital Object Identifier (DOI)

start page

  • 187

end page

  • 192

volume

  • 136

issue

  • 2-3