Rutherford backscattering spectrometry analysis of TiO2 thin films Conference

Fernandez-Lima, F, Vigil, E, Zumeta, I et al. (2003). Rutherford backscattering spectrometry analysis of TiO2 thin films . MATERIALS CHARACTERIZATION, 50(2-3), 155-160. 10.1016/S1044-5803(03)00084-6

International Collaboration

cited authors

  • Fernandez-Lima, F; Vigil, E; Zumeta, I; Freire, FL; Prioli, R; Pedrero, E

authors

date/time interval

  • July 7, 2002 -

publication date

  • March 1, 2003

webpage

published in

keywords

  • AFM
  • Materials Science
  • Materials Science, Characterization & Testing
  • Materials Science, Multidisciplinary
  • Metallurgy & Metallurgical Engineering
  • RBS
  • ROUGH FILMS
  • SEM
  • SPECTROSCOPY
  • Science & Technology
  • Technology
  • TiO2
  • film

Location

  • RIO DE JANEIRO, BRAZIL

Digital Object Identifier (DOI)

Conference

  • 1st Meeting of the Brazilian-Society-for-Materials-Research

publisher

  • ELSEVIER SCIENCE INC

start page

  • 155

end page

  • 160

volume

  • 50

issue

  • 2-3