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Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials
Conference
Chung, JY, Sertel, K, Volakis, JL. (2008). Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials .
10.1109/APS.2008.4619801
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Chung, JY, Sertel, K, Volakis, JL. (2008). Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials .
10.1109/APS.2008.4619801
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cited authors
Chung, JY; Sertel, K; Volakis, JL
authors
Volakis, John
publication date
November 13, 2008
Identifiers
Digital Object Identifier (DOI)
https://doi.org/10.1109/aps.2008.4619801
International Standard Book Number (ISBN) 13
9781424420421
