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Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials
Conference
Chung, JY, Sertel, K, Volakis, JL. (2008). Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials .
10.1109/APS.2008.4619801
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Chung, JY, Sertel, K, Volakis, JL. (2008). Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials .
10.1109/APS.2008.4619801
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cited authors
Chung, JY; Sertel, K; Volakis, JL
authors
Volakis, John
publication date
November 13, 2008
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Digital Object Identifier (DOI)
https://doi.org/10.1109/aps.2008.4619801
