Conformal Galerkin testing for VIE using parametric geometry Article

Usner, BC, Sertel, K, Volakis, JL. (2004). Conformal Galerkin testing for VIE using parametric geometry . ELECTRONICS LETTERS, 40(15), 926-928. 10.1049/el:20045004

keywords

  • ELEMENTS
  • Engineering
  • Engineering, Electrical & Electronic
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • INST ENGINEERING TECHNOLOGY-IET

start page

  • 926

end page

  • 928

volume

  • 40

issue

  • 15