High-Frequency EM Characterization of Through-Wall Building Imaging Article

Chang, Paul C, Burkholder, Robert J, Volakis, John L et al. (2009). High-Frequency EM Characterization of Through-Wall Building Imaging . IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 47(5), 1375-1387. 10.1109/TGRS.2009.2016082

cited authors

  • Chang, Paul C; Burkholder, Robert J; Volakis, John L; Marhefka, Ronald J; Bayram, Yakup

sustainable development goals

authors

publication date

  • May 1, 2009

webpage

published in

keywords

  • DIFFRACTION
  • Engineering
  • Engineering, Electrical & Electronic
  • Geochemistry & Geophysics
  • High-frequency techniques
  • Imaging Science & Photographic Technology
  • Physical Sciences
  • Remote Sensing
  • SCATTERING
  • Science & Technology
  • Technology
  • radar imaging
  • ray methods
  • through-wall propagation

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 1375

end page

  • 1387

volume

  • 47

issue

  • 5