A Non-Invasive Metamaterial Characterization System Using Synthetic Gaussian Aperture Article

Chung, Jae-Young, Sertel, Kubilay, Volakis, John L. (2009). A Non-Invasive Metamaterial Characterization System Using Synthetic Gaussian Aperture . IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 57(7), 2006-2013. 10.1109/TAP.2009.2021923

keywords

  • COMPLEX PERMITTIVITY
  • DIELECTRIC-CONSTANT
  • Engineering
  • Engineering, Electrical & Electronic
  • Free-space measurement
  • Gaussian beam
  • MICROWAVE
  • PERMEABILITY
  • Science & Technology
  • Technology
  • Telecommunications
  • material characterization
  • metamaterial
  • synthetic aperture

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 2006

end page

  • 2013

volume

  • 57

issue

  • 7