JIN, JM, VOLAKIS, JL. (1989). NEW TECHNIQUE FOR CHARACTERIZING DIFFRACTION BY INHOMOGENEOUSLY FILLED SLOT OF ARBITRARY CROSS-SECTION IN THICK CONDUCTING PLANE
.
ELECTRONICS LETTERS, 25(17), 1121-1123. 10.1049/el:19890753
JIN, JM, VOLAKIS, JL. (1989). NEW TECHNIQUE FOR CHARACTERIZING DIFFRACTION BY INHOMOGENEOUSLY FILLED SLOT OF ARBITRARY CROSS-SECTION IN THICK CONDUCTING PLANE
. ELECTRONICS LETTERS, 25(17), 1121-1123. 10.1049/el:19890753