NEW TECHNIQUE FOR CHARACTERIZING DIFFRACTION BY INHOMOGENEOUSLY FILLED SLOT OF ARBITRARY CROSS-SECTION IN THICK CONDUCTING PLANE Article

JIN, JM, VOLAKIS, JL. (1989). NEW TECHNIQUE FOR CHARACTERIZING DIFFRACTION BY INHOMOGENEOUSLY FILLED SLOT OF ARBITRARY CROSS-SECTION IN THICK CONDUCTING PLANE . ELECTRONICS LETTERS, 25(17), 1121-1123. 10.1049/el:19890753

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • IEE-INST ELEC ENG

start page

  • 1121

end page

  • 1123

volume

  • 25

issue

  • 17