Yield strength enhancement of MgO by nanocrystals Article

Chen, J, Schmidt, N, Chen, J et al. (2005). Yield strength enhancement of MgO by nanocrystals . JOURNAL OF MATERIALS SCIENCE, 40(21), 5763-5766. 10.1007/s10853-005-2476-8

cited authors

  • Chen, J; Schmidt, N; Chen, J; Wang, L; Weidner, DJ; Zhang, J; Wang, Y



  • Direct measurement of the average yield strength for individual grain using X-ray diffraction, which avoids the influence of a bulk sample quality on identation or deformation experiments, is presented. This method has been widely used in measuring residual stresses in materials. The technology was extended here to measure the stress in a powder sample during loading. Since stresses are generated by grain-to grain contact, the method has been applied to measure the strength of superhard materials such as diamond.

publication date

  • November 1, 2005

published in

Digital Object Identifier (DOI)

start page

  • 5763

end page

  • 5766


  • 40


  • 21