In situ studies of the properties of materials under high-pressure and temperature conditions using multi-anvil apparatus and synchrotron X-rays
Article
Parise, JB, Weidner, DJ, Chen, J et al. (1998). In situ studies of the properties of materials under high-pressure and temperature conditions using multi-anvil apparatus and synchrotron X-rays
. 28(1), 349-374. 10.1146/annurev.matsci.28.1.349
Parise, JB, Weidner, DJ, Chen, J et al. (1998). In situ studies of the properties of materials under high-pressure and temperature conditions using multi-anvil apparatus and synchrotron X-rays
. 28(1), 349-374. 10.1146/annurev.matsci.28.1.349
Increased access to multi-anvil high-pressure devices interfaced to synchrotron X-ray radiation sources has led to a new class of experiments. These new capabilities include (a) high-precision crystal structure determination and refinement from powder X-ray diffraction data; (b) the determination of kinetic parameters and structure from time-resolved diffraction data; (c) the determination of absolute pressures by the combined use of ultrasonic techniques at high pressures and temperatures with simultaneous monitoring of X-ray diffraction; and (d) the determination of the strength and rheological properties of materials through the monitoring of the relaxation of broadened diffraction peak widths in the presence of a well-characterized deviatoric stress field generated in the multi-anvil high-pressure apparatus.
