The imaging plate system interfaced to the large-volume press at beamline X17B1 of the national synchrotron light source
Book Chapter
Chen, J, Parise, JB, Li, R et al. (1997). The imaging plate system interfaced to the large-volume press at beamline X17B1 of the national synchrotron light source
. 101 139-144. 10.1029/GM101p0139
Chen, J, Parise, JB, Li, R et al. (1997). The imaging plate system interfaced to the large-volume press at beamline X17B1 of the national synchrotron light source
. 101 139-144. 10.1029/GM101p0139
A double imaging plate is interfaced to the Large Volume High Pressure Device (LVHPD) SAM-85 for the collection of in situ X ray powder diffraction data suitable for Rietveld analysis. The two-dimensional detector, combined with the uniform pressure and temperature environments of the LVHPD and the wide energy range available from a new Laue-Bragg monochromator at X17B1, results in high-quality diffraction data suitable for Rietveld refinements. A disk-type heater is used to minimize extrinsic diffraction peaks from the surrounding materials. Diffraction effects resulting from the boron-epoxy pressure transmitting medium are removed by subtraction. To demonstrate the quality of data obtained from the imaging-plate system, the cation distributions over the available sites in the crystal structures of NiAl2O4-spinel and (Ni,Mg)2SiO4-olivine have been refined from data collected at high pressures and temperatures. In both cases cation ordering is observed to increase with pressure.
