Structure Determination of High Pressure Phases of Bismuth by Synchrotron Radiation Angle Dispersive Powder Diffraction Article

Jiuhua, C, Hiroshi, I, Takumi, K et al. (1995). Structure Determination of High Pressure Phases of Bismuth by Synchrotron Radiation Angle Dispersive Powder Diffraction . Review of High Pressure Science and Technology/Koatsuryoku No Kagaku To Gijutsu, 4(1), 28-34. 10.4131/jshpreview.4.28

cited authors

  • Jiuhua, C; Hiroshi, I; Takumi, K; Jiuhua, C

abstract

  • High quality diffraction data of high pressure phases of bismuth, Bi III, Bi III’ and Bi IV, were obtained by using the high energy Synchrotron Radiation. Based on the observed diffraction data, crystal structures of these phases have been solved as, Bi III : tetragonal structure with unit cell parameters of a=0.8680 ± 0.0005 nm and c=0.4248± 0.0003 nm at 3.2 GPa, Bi III’: the same structure as Bi III, and Bi IV: monoclinic structure with unit cell parameters of a=0.6463 ±0.0005nm, b=0.6460±0.0005nm, c=0.6582±0.0006 nm and γ=118.84±0.05° at 3.9 GPa and 503 K. The relations of atomic arrangements between Bi III and Bi V, Bi IV and Bi V are discussed. © 1995, The Japan Society of High Pressure Science and Technology. All rights reserved.

authors

publication date

  • January 1, 1995

published in

Digital Object Identifier (DOI)

start page

  • 28

end page

  • 34

volume

  • 4

issue

  • 1