Scanning tunneling microscopy applications in electrochemistry - beyond imaging Review

Tao, NJ, Li, CZ, He, HX. (2000). Scanning tunneling microscopy applications in electrochemistry - beyond imaging . Journal of Electroanalytical Chemistry and Interfacial Electrochemistry, 492(2), 81-93. 10.1016/S0022-0728(00)00295-3

cited authors

  • Tao, NJ; Li, CZ; He, HX

publication date

  • October 20, 2000

published in

keywords

  • ATOMIC-FORCE MICROSCOPY
  • Chemistry
  • Chemistry, Analytical
  • ELECTRODE-ELECTROLYTE INTERFACE
  • Electrochemistry
  • IN-SITU STM
  • METALLIC NANOWIRES
  • MOLECULAR ADSORBATES
  • POINT-CONTACT
  • PROBE LITHOGRAPHY
  • Physical Sciences
  • QUANTIZED CONDUCTANCE
  • SURFACE-DIFFUSION
  • Science & Technology
  • UNDERPOTENTIAL DEPOSITION
  • fabricating nanostructures
  • probing electron transfer
  • scanning tunnel microscopy

Digital Object Identifier (DOI)

start page

  • 81

end page

  • 93

volume

  • 492

issue

  • 2