Probing electrical transport in individual carbon nanotubes and junctions Article

Kim, Tae-Hwan, Wendelken, John F, Li, An-Ping et al. (2008). Probing electrical transport in individual carbon nanotubes and junctions . NANOTECHNOLOGY, 19(48), 10.1088/0957-4484/19/48/485201

cited authors

  • Kim, Tae-Hwan; Wendelken, John F; Li, An-Ping; Du, Gaohui; Li, Wenzhi

authors

publication date

  • December 3, 2008

webpage

published in

keywords

  • GROWTH
  • Materials Science
  • Materials Science, Multidisciplinary
  • Nanoscience & Nanotechnology
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Science & Technology - Other Topics
  • Technology
  • Y-JUNCTIONS

Digital Object Identifier (DOI)

publisher

  • IOP PUBLISHING LTD

volume

  • 19

issue

  • 48