A method for measuring the elastic modulus of thin films Article

Shi, JD, Wu, KH, Larkins, G. A method for measuring the elastic modulus of thin films . MATERIALS CHARACTERIZATION, 38(4-5), 301-303. 10.1016/S1044-5803(97)00084-3

cited authors

  • Shi, JD; Wu, KH; Larkins, G

authors

published in

keywords

  • Materials Science
  • Materials Science, Characterization & Testing
  • Materials Science, Multidisciplinary
  • Metallurgy & Metallurgical Engineering
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE INC

start page

  • 301

end page

  • 303

volume

  • 38

issue

  • 4-5