Defect avoidance in a 3-D heterogeneous sensor Conference

Chapman, GH, Jain, V, Bhansali, S. (2004). Defect avoidance in a 3-D heterogeneous sensor . 67-75. 10.1109/DFTVS.2004.1347826

keywords

  • Computer Science
  • Computer Science, Hardware & Architecture
  • Science & Technology
  • Technology

Location

  • Cannes, FRANCE

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 10

Conference

  • 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

publisher

  • IEEE COMPUTER SOC

start page

  • 67

end page

  • 75