Effects of Dielectric Deposition on the Electrical Characteristics of MIM Tunnel Junctions Conference

Ratnadurai, R, Krishnan, S, Stefanakos, E et al. (2010). Effects of Dielectric Deposition on the Electrical Characteristics of MIM Tunnel Junctions . 5 1059-1062. 10.1016/j.proeng.2010.09.292

Open Access

cited authors

  • Ratnadurai, R; Krishnan, S; Stefanakos, E; Goswami, DY; Bhansali, S

sustainable development goals

authors

date/time interval

  • September 5, 2010 -

publication date

  • January 1, 2010

webpage

keywords

  • Chemistry
  • Chemistry, Analytical
  • Engineering
  • Engineering, Electrical & Electronic
  • METAL DIODES
  • MIM
  • Materials Science
  • Materials Science, Multidisciplinary
  • Nanoscience & Nanotechnology
  • NiO
  • Physical Sciences
  • Rectenna
  • Science & Technology
  • Science & Technology - Other Topics
  • Sputtering
  • THIN
  • Technology
  • Tunneling

Location

  • Linz, AUSTRIA

Digital Object Identifier (DOI)

Conference

  • 24th Eurosensor Conference

publisher

  • ELSEVIER SCIENCE BV

start page

  • 1059

end page

  • 1062

volume

  • 5