Dielectric relaxation in nanopillar NiFe-silicon structures in high magnetic fields Article

Vasic, R, Brooks, JS, Jobiliong, E et al. (2007). Dielectric relaxation in nanopillar NiFe-silicon structures in high magnetic fields . 7(1), 34-38. 10.1016/j.cap.2005.08.002

Open Access

cited authors

  • Vasic, R; Brooks, JS; Jobiliong, E; Aravamudhan, S; Luongo, K; Bhansali, S

authors

publication date

  • January 1, 2007

keywords

  • ADMITTANCE MEASUREMENTS
  • FREEZEOUT
  • GAAS
  • Materials Science
  • Materials Science, Multidisciplinary
  • NANOWIRES
  • NiFe nanowires
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Si : P
  • Technology
  • dielectric relaxation
  • high magnetic fields
  • nanostructured silicon

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE BV

start page

  • 34

end page

  • 38

volume

  • 7

issue

  • 1