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High Throughput Measurement of DNA Base Lesion Repair Capacity
Patent
High Throughput Measurement of DNA Base Lesion Repair Capacity .
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Overview
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Overview
Inventor
Lai, Yanhao
FIU Researcher
Liu, Yuan
Person
date issued
November 7, 2017
webpage
https://patents.google.com/patent/US9809843
Identifiers
patent number
US/9,809,843
